Used ISI SS40 #36254 for sale

ISI SS40 Scanning Electron Microscope (SEM) is an analytical instrument designed for high resolution imaging in the fields of material science, life sciences, and more. It is capable of imaging a wide variety of samples, from macroscopic to nanoscopic scales, and of measuring features down to the atomic level. The SEM utilizes unfocused electron beams emitted from a tungsten filament source that scatter off the surface of the sample and onto the detector. The imaging is done in a vacuum environment, which enables the electrons to travel through the specimen undisturbed. By observing the interactions between the beam and the sample, images with molecular level detail can be obtained. SS40 SEM is equipped with an aberration-corrected electron lens, allowing for direct imaging of fine features in the sub-50 nm range. It also features an advanced Pixcel detector for outstanding sensitivity and signal-to-noise ratio. ISI SS40 is optimized for both analytical and imaging applications, using its wide range of features for the analysis of surface features, chemistry, topography, composition, etc. It has an algorithm-assisted analytical feature measurement detector (AFMD) with an integrated image stitching system. The AFMD is capable of accurately measuring the location of fine feature and measuring both in-plane and out-of-plane crystal orientations. Additionally, SS40 can provide correlative imaging modes, wherein simultaneous scanning electron and spectroscopic imaging can be obtained. ISI SS40 includes many other features specifically designed for greater efficiency, accuracy and convenience. It has an automated, low-vacuum alignment system with automated stage adjustments, and a built-in microwave plasma source for sputtering or cleaning operations. It also includes an automated sampler interface and an ergonomic user interface, complete with "easy access" touch control and graphics interfaces. SS40 is an incredibly powerful instrument for the study of nanoscale features and processes. From analytical and imaging capabilities to automated tools and systems, ISI SS40 is designed to facilitate high-resolution imaging and analysis of a wide range of samples.