Used ISI SX 30E #293631578 for sale

ISI SX 30E
ID: 293631578
Scanning Electron Microscope (SEM), parts system.
ISI SX 30E scanning electron microscope (SEM) is an advanced tool used for research in materials and biological sciences. It enables researchers to acquire high-resolution images of samples at the nanoscale. SX 30E features a tungsten filament X-ray source and digital image processing. With its large depth of field, the SX enables high-accuracy SEM image formation. The device offers an advanced range of scanning modes, including backscatter electron imaging (BSE), secondary electron imaging (SE), and secondary electron mapping (SEM). It also offers adjustable magnification ranging from 2,000x to 30,000x. Furthermore, ISI SX 30E offers enhanced electron optics and a built-in drive chamber. The latter provides smooth and accurate specimen movement, while the optimized electron optics enhance electron beam stability and optimize imaging performance. This makes it ideal for research requiring a lot of imaging. SX 30E allows users to acquire data in real-time or post-process to further enhance image quality. The real-time mode provides 'live' images, allowing for control of specimen regions and conditions during image acquisition. The post-processing mode enables users to optimize images for higher resolution and deeper analysis. The images generated by ISI SX 30E have accurate surface morphologies and crystal structures. This enables researchers to investigate complex structures of samples such as metals, ceramics and alloys. Further, images can also be used to conduct imaging analysis, such as elemental composition analysis. SX 30E is available in various models, and is compatible with Windows, Linux, and Mac operating systems. To use the device for imaging and data acquisition, a specialist PC and display are required, both of which are available from the manufacturer. In summary, ISI SX 30E is an advanced-level Scanning Electron Microscope equipped with several enhanced features. It is an ideal tool for making high-resolution images and conducting imaging analysis of nano-sized samples.
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