Used ISI SX 40 #187345 for sale

ISI SX 40 is a scanning electron microscope (SEM) designed for high-level microstructural analysis. ISI SX40 uses electron-phase contrast, allowing for detailed observation of microstructures. The microscope is capable of magnifications up to 15,000X. It features a high-resolution electron mirror, which reduces distortion in images and provides clear and sharp images of specimens. In addition, SX 40 incorporates automatic integration of the image and auto-background effects, allowing for easy analysis. SX40 can be used to analyze microstructures such as grains, precipitates, and low-contrast fine-grained components. It can also be used to detect voids, lattice defects, and microstructural features. ISI SX 40 is capable of allowing analysis of three-dimensional objects, such as ceramic capacitors, fine powders, and thin films. ISI SX40 has an automated data collection equipment and a series of user-friendly functions, for example, an automated positioning system for efficient data processing. The unit also allows for post-processing of sample images. SX 40 also features advanced control capabilities, such as a real-time control machine and preset scanner functions. SX40 is suitable for a wide range of applications, from samples with high mechanical strength to samples with fragile micromechanical structures. The microscope is capable of performing observation of micromechanical features, such as dispersive edges or converging and diverging features. ISI SX 40 has a range of additional features such as automated camera vibration, low-noise snapshot acquisition, and improved precision. In addition, the microscope has a dedicated user-interface, allowing users to manage and control the numerous functions of the SEM. ISI SX40 is a highly versatile microscope ideal for microstructural analysis. Its high resolution and automated functions allow users easy and efficient analysis of samples. It is an ideal microscope for research and industrial applications.