Used ISI SX 40 #9114412 for sale

ISI SX 40 is a scanning electron microscope (SEM) designed for a variety of industrial, medical, and research applications. It provides superior imaging performance in both low and high vacuum states via its state-of-the-art electron optics. It has a documented resolution of 1.2nm @ 30kV and 3nm @ 30kV, which translates to a very high level of detail when scanning samples. ISI SX40 is capable of both secondary and backscattered electron imaging, meaning it can detect a variety of different sample components. Secondary electrons reveal information on the surface elements, while backscattered electrons provide information on the sample composition and phase. SX 40 also has an optional in line EDS system for energy dispersive x-ray spectroscopy of samples. This allows it to analyze different elemental compositions of samples. SX40 has a stage area positioning accuracy of 3 µm - 5 µm with micrometre moves along axes X, Y, and Z without the need for manual adjustment. It is controllable via ISI RoboInvestor software suite which allows for a variety of commands and settings adjustments for a precise sample analysis. These include automatic deflectors and scans, adjustable voltage calibration, real-time scans, and image capture and comparison. ISI SX 40 has an automated sample changer, allowing for up to 250 samples to be quickly and easily swapped out and analyzed consecutively. It also has a 9" viewport which is ergonomically designed for extended viewing sessions when observing sample images. Overall, ISI SX40 is a powerful and reliable scanning electron microscope. Its versatility, easy set up, and accurate performance make it a perfect tool for both industrial and research requirements.