Used JAM 7000f #9243703 for sale

JAM 7000f is a scanning electron microscope (SEM) designed for imaging and microscopying applications. The instrument has exceptional high performance for a single column, as it features a curved anode field emission gun with an acceleration voltage up to 30 kV, a dwell time up to 1µs and an angle of incidence up to 85°. The advanced ultramicrotomy equipment allows specimen preparation with a thickness lowering up to 0.5 µm. Its automated stage allows scanning with ultra-high speed and accuracy. 7000f microscope's electron optics consists of a column of three lens apertures and two sets of objective lenses. The column is designed for low aberration, ensuring sharp images with excellent resolution of 0.8nm. An optional electrostatic beam scanning system helps to image larger specimens efficiently. The morphology of specimens is studied in an environmental SEM chamber with temperature control up to 55°C and relative humidity control up to 95%. Also, it is equipped with an energy dispersive microscopy (EDX) unit to analyze chemical composition of specimens. Gamma ray detectors and a Faraday cup make JAM 7000f a truly versatile porous laboration tool. The machine is connected with a dedicated PC loaded with special CAM500 image software to ensure high contrast and resolution images. The user friendly interface of this software allows easy sampling, surface cleaning and etching operations. Overall, 7000f is an excellent scanning electron microscope for high resolution imaging and analysis of specimens. It allows for obtaining detailed information about the physical structure, chemical composition as well as surface topography of specimens.