Used JAM 7001f #9243701 for sale

JAM 7001f is a scanning electron microscope (SEM) which uses a focused small particle beam of electrons to achieve digital imaging of a surface. Utilizing secondary electron (SE) imaging, backscattered electrons (BSE), and transmission electron (TE) imaging, 7001f provides powerful microscopic analysis of specimens at up to 100,000X magnification. JAM 7001f has a monochromatic electron gun that creates a highly focused spot of approximately 1 nanometer in diameter. When this electron beam is scanned across an object's surface, it produces signals that correspond to the characteristics of the sample. SE images depict atomic characteristics such as electron releasing, while BSE images show atomic number contrast, and TE images provide atomic positions. This enables the SEM to create a picture of even the smallest details of a specimen's surface. The genScan feature of 7001f allows for automated scanning of the entire specimen, providing an even more comprehensive and detailed analysis. Additionally, the genXR automated pattern recognition tool enables efficient qualitative and quantitative data to be collected. JAM 7001f is one of the most advanced and reliable imaging systems available, offering quality imaging resolution and unsurpassed sensitivity. The microscope also features a fully enclosed specimen chamber, improved vacuum pumps, and built-in specimen holders which provide better stability, shielding, and protection of samples. 7001f also features an open software design which allows users to incorporate automated interfacing of tools, databases, 3D volumetric data, as well as custom algorithms. It also includes the ImageVision™ imaging software which features advanced image processing, 3D image rendering, and batch processing capabilities. In summary, JAM 7001f is an excellent choice for those who need high resolution imaging, precise feature measurement, and comprehensive analysis. With its automated scanning, robust hardware design, and powerful imaging software, 7001f is an ideal choice for a wide variety of SEM applications.