Used JAM JSM 7000F #9260023 for sale

JAM JSM 7000F
ID: 9260023
Scanning Electron Microscope (SEM).
JAM JSM 7000F is a scanning electron microscope (SEM) used for the observation of surface features and composition of small samples in a variety of research settings. This instrument is capable of producing extremely high-resolution images at the atomic level. It has a wide variety of features that make it ideal for a variety of applications. JSM 7000F has an effective sampling area of 11 cm2 and a resolution of between 0.2 and 50 nm. It has an acceleration voltage of up to 10 kV, which allows for crisp imaging and high sensitivity. The microscope is also equipped with an in-lens electromagnetic field (EMF) detector, which improves the detection of low-energy signals and reduces noise. The beam current is also adjustable, allowing users to obtain images with extremely high contrast and detail. The microscope also features an on-axis, manually adjustable, two-stage magnetic lens system which enables it to achieve maximum resolution and suitable imaging results. Additionally, the scanning ladder system allows for the simultaneous acquisition of multiple images with different magnification settings. This system can also be used to control the scanning speed and the duration of the signal acquisition. JAM JSM 7000F is equipped with an automated specimen exchange (ASE) function, which allows for specimens to be quickly, accurately, and safely exchanged from one holder to another. The ASE can be used for specimens that require both air- or liquid-cooling techniques. This feature also allows for the analysis of different types of elements and material compositions. The built-in detector is capable of producing images in either bright- or dark-field settings. Furthermore, the use of an electron backscatter diffraction (EBSD) detector can also be used to process and analyze images, enabling researchers to understand the crystallographical orientation of each sample. Overall, JSM 7000F offers unrivaled imaging and analysis capabilities. It has reduced electron-beam irradiation and automated specimen exchange capabilities, along with high resolution imaging. This makes it a top choice for the analysis of small samples in a variety of research settings.
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