Used JEOL 100 / 200 Series #9192825 for sale

JEOL 100 / 200 Series is a scanning electron microscope (SEM) designed for a variety of research applications. 100 / 200 Series is equipped with a high magnification field emission scanning electron microscope enabling high resolution imaging and analysis of components as small as 1 nm. It is especially well-suited for applications such as microstructure analysis, surface morphology observation and analysis, and compositional mapping, and enables researchers to clearly observe the shape and size of nanoscale objects. JEOL 100 / 200 Series is also equipped with an energy dispersive X-ray energy spectrometer to analyze the composition of analyzed particles, enabling accurate element composition mapping of particles, and materials analysis. In addition, 100 / 200 Series can also perform electron beam lithography, which is used to build nanostructures. It can fabricate patterns on the surface of the sample with the beam up to 1 nm in size, allowing for nanoscale fabrication of components. JEOL 100 / 200 Series is controlled through a dedicated workstation, enabling intuitive manipulation of the SEM. 100 / 200 Series is an effective tool for conducting research and analysis on tiny components. With its high resolution imaging, accurate energy dispersive X-ray spectrometry, and high resolution electron beam lithography, it can accurately map out the structures and composition of objects as small as 1 nanometer, providing researchers the ability to analyze parts in minute detail, allowing them to observe and study structures and components that would otherwise be difficult to see.