Used JEOL 100C #126353 for sale

JEOL 100C Scanning Electron Microscope (SEM) is a powerful analytical tool utilized for many applications ranging from life sciences to materials engineering. It utilizes advanced electron optics, multiple detectors, and a customized software package to perform high-resolution imaging, elemental analysis, and chemical analysis. 100C features a high vacuum-compatible chamber, neoteric electron gun, and a motorized stage, providing a wide range of possibilities in research. JEOL 100C offers up to 10 nm resolution in secondary-electron imaging and up to 5 nm resolution in a backscattered-electron imaging mode. Its electron gun has a maximum working distance of 150 mm and a maximum accelerating voltage of 30 KV. It additionally has a selectable chamber pressure range as low as 10-3 Pa which allows for low-vacuum operation. The high-vacuum operation with 6 nm resolution is ideal for high-resolution imaging of samples with low surface roughness. 100C is equipped with a wide range of detectors which can be utilized in both imaging and analysis modes. These include a large STEM detector providing elemental and chemical analysis, along with an image filter for contrast enhancement and a backscatter detector for sample analysis. Moreover, JEOL 100C also features a secondary-electron detector, an EDX detector, and a charging detector for comprehensive analysis. The customized control software suite on 100C offers a broad range of capabilities. These include navigation control with an easy to use polar navigation system, image filter control for contrast enhancement, and full-stage programmability for automated imaging and analysis. Furthermore, JEOL 100C also supports sample preparation, such as cross-sectional analysis, and has an integrated special-features library for specialized applications. In conclusion, 100C is an advanced scanning electron microscope providing high-resolution imaging and advanced analysis of a wide range of samples. Featuring motorized stages, high-vacuum compatible chamber, and a wide range of detectors, it is an ideal tool for many applications. Lastly, the integrated software package of JEOL 100C ensures the consistent and timely execution of imaging and analysis tasks.