Used JEOL 100CX #293765836 for sale

JEOL 100CX is a scanning electron microscope (SEM) equipped with modern technology to provide high resolution imaging and analysis capabilities. 100CX features a Cs-corrected electron gun, a field emission type electron gun, a top-view display unit, and a dual detector equipment with a bottom-view digital imaging system. This reliable and highly efficient SEM offers a quick and easy way to analyze and image a wide variety of samples. The Cs-corrected electron gun within JEOL 100CX provides improved performance by increasing electron beam stability for a range of imaging and analytical applications. This efficient electron gun features a long working distance and high current density. The field emission type electron gun also produces high resolution images of small samples or fine features within a sample. The top-view display unit in 100CX allows real time monitoring of the scanning area without requiring the user to change their position. In addition to the Cs-corrected and field emission type electron guns, JEOL 100CX is also equipped with a dual detector unit for increased image contrast and quality. The primary detector is a high resolution imaging detector machine that features an angular emission chamber over a large range of angles of incidence. This detector produces detailed images of fine structures of samples. The digital imaging tool provides a bottom-view display for a clear view of full view of the sample. Overall, 100CX scanning electron microscope is ideal for imaging and analysis applications in a variety of industries. Due to its robust Cs-corrected and field emission type electron guns, dual detector asset, top-view display, and bottom-view digital imaging model, JEOL 100CX provides improved accuracy and efficiency within the electron microscope market.