Used JEOL 100CX #9096279 for sale

JEOL 100CX scanning electron microscope (SEM) is a versatile, full-featured analytical instrument. It is a cost-effective solution for both research and industrial applications. 100CX is designed with a specially engineered vacuum chamber and environmental chamber, which allows for a high degree of image quality and maximum flexibility. The equipment is equipped with a cold cathode electron gun, a three-stage condenser lens, and a dual-beam astigmatism scanning system to deliver maximum performance. This unit enables not just the highest resolution imaging, but also elemental and isotopic analysis. JEOL 100CX offers a range of imaging capabilities, including high vacuum scanning (HVS), low-vacuum scanning (LVS) and variable pressure scanning modes (VPS). HVS is ideal for high-contrast imaging, and LVS is best for imaging of non-conductive specimens. Additionally, VPS can be used for imaging of various coatings with an analysis depth of up to 7μm. 100CX also offers energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry (WDS) capabilities. This allows for elemental composition mapping and analysis and the identification of elements down to 21 nm-diameter spots. Furthermore, this machine is equipped with a Schottky field emission electron source which reduces charge build-up and improves resolution. The tool also has several versatile features to maximize its capabilities. The beam variator, for example, can tilt the beam up to ± 55° from the sample surface, while the "dynamic focus" feature improves image resolution. The "loudspeaker mode" feature also increases resolution and improves the contrast of non-conductive samples. Overall, JEOL 100CX is a powerful scanning electron microscope capable of a wide range of imaging and analysis applications. Its versatile design and capabilities make it well-suited for both research and industrial applications, providing users with an excellent solution for their needs.