Used JEOL 100CX #9113928 for sale

JEOL 100CX
ID: 9113928
Scanning electron microscope, SEM.
JEOL 100CX is a scanning electron microscope (SEM) designed for applications requiring high resolution, large depth of field, and high contrast imaging. It is an ideal choice for a wide range of materials science research and industrial applications, including the analysis of metals, plastics, semiconductors, and ceramics. 100CX uses a tungsten (W) filament as its electron source, which provides a very high-resolution image, allowing users to examine and analyze features in the nanometer range. This SEM features a high-power W filament to produce a high-resolution image that is ideal for ultra-low-kV imaging and high magnification. JEOL 100CX has a large 25 mm-diameter field of view allowing users to see the whole picture clearly. It features an advanced differential pumping stage which delivers high stability, low vibration, and clean vacuum environment. The variable pressure control provides the user with the capability of changing the operating pressure from a minimum of 10-4 mbar to a maximum of 10-5 mbar for better low-kV imaging. The differential pumping system also benefits from variable pumping radius, enabling the sample chamber to maintain a clean vacuum environment for a wide range of sample sizes. One of the most advantageous features of 100CX is that it uses a low-kV imaging technique. This technique offers more contrast and resolution than conventional imaging, even when imaging at higher magnifications. The high-resolution images generated by JEOL 100 CX are also capable of showing surface features in greater detail. JEOL 100CX also offers an array of automated features such as sample stage alignment, high speed autofocus, and automated sub-sampling. These features allow users to efficiently obtain the data they need without manual adjustment, which minimizes user variability and error. Other advanced features include a motorized sample changer for automated sample changes, a computer controlled system for switching between detectors, and an automated analysis software package. Overall, 100CX is an advanced scanning electron microscope with features and capabilities that make it an excellent choice for many materials science and industrial applications. With its high-resolution imaging, low-kV imaging technique, and a host of automated features, it provides users with a powerful and reliable tool for conducting high-quality imaging and analysis.
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