Used JEOL 1010 #293752648 for sale

JEOL 1010 is a scanning electron microscope (SEM). It features a variable pressure, variable energy (VPVE) gun with a beam energy of up to 20 keV, providing a range of imaging resolutions from 500 nm down to 0.2 nm. It also features a magnification range of 30x to 500kx, along with the ability to obtain analytical data in situ. The base 1010 model includes an EDS detector system with an ultra-high performance EDX hardware, which allows sensitive EDS analysis over a wide range of energies from 3 keV to 15 keV. It also comes equipped with an InLENS (in-lens electron spectrometer) for quantitative analysis of light elements, and eSNAP (electron STEM nanoprobe analyzer) for fast and accurate imaging and analysis of nano-objects. The SEM incorporates a fully integrated SE/BSE detector system. This provides enhanced clarity and definition of sample features as well as improved spectra data through its combination of SE/BSE detector and new PolyFlux technology. Additionally, the low-kV stage for imaging specimens in low-vacuum conditions allows for taking clear images of highly-sensitive samples. JEOL 1010 has a wide array of software support available for users. The EDS Data Acquisition software is designed to provide users with automated material analysis capabilities and link to other software suites. The Video FeatureMeasurement (AFM) software provides advanced automation of image analysis and feature measurement tasks. The new HistoGram analysis software suite also provides users with automated analysis of histogram images for quick assessments of morphology. 1010 is an advanced scanning electron microscope that is able to obtain detailed imaging and analytical data of nano-structures. Its combination of variable energy and variable pressure capabilities, along with a wide range of imaging resolutions and analytical abilities, make it a powerful tool for various industries that require nano-scale analysis.