Used JEOL 1200EX #9132459 for sale

JEOL 1200EX is one of the most advanced scanning electron microscopes (SEMs) in the world. Developed in Japan by JEOL Corporation, JEOL 1200-EX features an ultra-high-resolution cold field-emission field gun (FE-FEG) to provide excellent image quality. 1200 EX can provide an analytical depth of 0.5 nm with an acceleration voltage of 1kV, while its maximum resolution reaches 0.08 nm in ZAE mode. This makes it well suited for imaging nanometer-scale structures. 1200-EX is also equipped with three detector ports, providing a variety of imaging textures and contrasts, including secondary electrons, backscattered electrons, and combined secondary and backscattered electrons. 1200EX features a variable pressure mode, allowing samples to be viewed without coating or vacuum. This enables low-damage imaging and analysis of sensitive samples. In addition, JEOL 1200 EX is equipped with a large-area ESaber-type chamber, which allows samples up to 80 x 50 mm in size to be viewed and analyzed. JEOL 1200EX has expanded optical capabilities, such as a high-resolution digital microscope, which allows simultaneous observation of features at a resolution of up to 5 μm. It also offers imaging modes such as SEM/EBSD and EDX, allowing for chemical analysis of samples. JEOL 1200-EX is a reliable and user-friendly instrument, offering advanced features such as a fully automated alignment system to ensure repeatable, high-quality results. Its user-friendly operation system, including a remote control device and a full-color LCD monitor, ensure ease of use and trouble-free operation. In summary, 1200 EX is an extremely versatile and sensitive SEM with high-resolution imaging capabilities. Its high-resolution imaging modes, expandable microscopy capabilities, and user-friendly features mean that it is ideally suited for a range of applications, from material failure analysis to nanotechnology research.