Used JEOL 1400 #9149595 for sale

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ID: 9149595
Transmission electron microscope (TEM).
JEOL 1400 is a scanning electron microscope (SEM) that operates with a combination of magnetic, electrostatic, and primary electron fields. It is an extremely powerful analytical tool for the inspection of microscopic material surfaces, and has been utilized extensively in industry, in research laboratories and in universities around the world for decades. 1400 offers excellent performance in terms of resolution and image contrast. Using a technique known as "immersion" in which the microscope's objective lens is immersed in an optical medium such as liquid helium or a vacuum chamber, this type of SEM can produce extremely high-resolution images: as high as 100 nanometers. Its low-vacuum Chamber also yields excellent image quality, ensuring accurate results that can be verified and reproduced for future reference. JEOL 1400 is equipped with a digital imaging system using photographic plates or digital cameras to capture images. These images can then be transferred to a computer, allowing for further analysis and image manipulation. The aluminum sample chamber and specimen mount of 1400 can accept a wide range of sample materials, including metals, ceramics, biological tissue, plastics, and other materials. This makes it well-suited to a wide variety of applications. JEOL 1400 is capable of detecting a wide range of features on the surface of a sample. Its unique electron beam deflection technique is able to precisely locate features at very small scales, such as nanometer-scale images. This allows for the analysis of features such as grain sizes, crystal lattices, area density, oxidation states, and coatings. In addition to its impressive imaging capabilities, 1400 also supports Texture Analysis. This allows the user to calculate a variety of properties, including roughness, waviness, and spherical deviation. JEOL 1400 has a range of vital parameters to ensure accurate operation, such as working distance, accelerating voltage, electron beam current and deflector voltage. The microscope can also be operated in both the "plan" and "vertical" configurations, allowing for different applications. 1400 is a powerful tool that can be used for a variety of applications including failure analysis, metallurgical examination, non-destructive testing, and detailed surface inspections. Its combination of high resolution and outstanding image quality, along with its flexibility and ease of use, make JEOL 1400 an excellent choice for a range of applications.
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