Used JEOL 2000FX #78020 for sale

JEOL 2000FX is a High Resolution Field Emission Scanning Electron Microscope (FESEM) that provides qualitative imaging, elemental analysis, and nanoscale material characterization. It is capable of operating in both high and low vacuum modes, with a range of 0.5 to 10 nm resolution. JEOL 2000-FX utilizes a field emission gun (FEG) to generate a very stable, high-resolution electron beam, providing enhanced contrast and resolution. The gun is equipped with a Gatan Performus™ 12k x 12k CCD Imaging Detector for high-contrast, high-resolution imaging. Its anti-contamination system utilizes a combination of light ion bombardment and liquid nitrogen cooling to reduce the must common sources of specimen contamination. 2000FX also features an easy-to-operate low-vacuum mode designed for nanoscale material characterization. The low-vacuum mode provides the same imaging and analysis capabilities as the high-vacuum mode but with a reduced vacuum level, using a special FESEM column designed specifically for nanoscale materials. This mode is ideal for studying nanomaterials, as nanoscale features retain their shape and size without distortion. 2000-FX includes several optional accessories for expanded capabilities. These include a single tilt specimen holder for collecting EDX analysis in tilted views for three-dimensional imaging, an Advanced Transmitted Illumination Detector (ATILD) for imaging extremely low voltage micrographs with excellent resolution, and an Internal Magnetic Field Objective Lens for imaging magnetic materials in high-resolution. JEOL 2000FX is a powerful and versatile imaging tool, capable of providing qualitative imaging, elemental analysis, and nanoscale characterization at an affordable price. With its fast data acquisition time, easily operated low-vacuum mode for nanomaterials, and optional accessories for expanded capabilities, JEOL 2000-FX is an ideal choice for many imaging and analysis applications.