Used JEOL 2000FX #9389978 for sale

JEOL 2000FX is a state-of-the-art scanning electron microscope (SEM) designed for high performance imaging at the sub-microscopic level. JEOL 2000-FX is a multi-purpose microscope that allows for high resolution imaging of specimens ranging from 10nm to 1 micron, making it ideal for assessing micro-structures in a variety of samples. Its advanced electron optics feature an immersion-type high-performance objective lens and highly tuned electron optics with ultra-low aberration and high resolution. Additionally, 2000FX has a wide range of imaging modes and techniques, from backscattered electron imaging to x-ray elemental analysis, giving it the capability to analyze both the surface and subsurface structures of specimens. 2000-FX features a patented Everhart-Thornley paired-grid current collection system, which provides reliable low background, high contrast imaging and high spatial resolution. The length of the ever-evolving Everhart-Thornley detector, results in a wider viewing angle, reducing the need for excessive image assembly to view large fields of view. Conversely, its non-evolving layout allows for faster data acquisition and quicker imaging times. JEOL 2000FX also includes a sample stage tilt control, allowing for more accurate viewing of tilted sample structures. This setup, combined with fully automated functions such as auto-centering, illuminated cross-hair, and semi-automated optical alignment yield repeatable and accurate results. JEOL 2000-FX also features a high vacuum system, which provides stability in the working environment and increases the resolution of the images produced. The high vacuum is generated inside the microscope chamber, eliminating the need for a separate vacuum pump and chamber, as well as reducing cost and power consumption. Furthermore, 2000FX has a built-in 3600C|° electron source, which generates a continuously stable beam for a long period of time with no need for manual adjustment. The combination of the advanced electron optics, Everhart-Thornley detector, automated functions, and high vacuum allows for 2000-FX to produce sharp, clear images of a variety of sample materials. Overall, JEOL 2000FX Microscope offers powerful and precise imaging capabilities for a variety of applications. With its advanced electron optics and automated functions, JEOL 2000-FX can be used for both surface and deep imaging. Its wide range of features allow for quick and efficient analysis of structures at the sub-microscopic level with reliable accuracy and repeatability.