Used JEOL 2010 #9157313 for sale

JEOL 2010 is a high performance sweeping electron microscope (SEM) which is designed for imaging and analysing a wide range of material samples. It offers high resolution imaging with an accelerated electron beam up to 10kV, and allows ultra-low voltages for up to 50nm resolution. It features an impressive 4 independently adjustable scanning stages as well as a cooling temperature controller that maintains a desired temperature during imaging and specimen manipulation. 2010 has a built-in Scanning Annular Dark Field (ADF) detector and a proprietary Focus Drift Compensation equipment for blur-free imaging and increased magnification. The ADF system also provides information about the specimen topography at various depths for higher accuracy in imaging of specific features. The proprietary EDS (Energy-dispersive X-ray spectroscopy) detector can accurately analyze elemental composition and morphology of specimens. JEOL 2010 also features a dedicated Heating/Glow Discharge Module for coating samples with an ultra-thin layer of gold or other metals. This coating can enhance sample visibility and provide high contrast imaging. The module is equipped with an integrated heating plate and a Temperature Monitor for perfect fine-tuning of the film structure in order to obtain the desired final imaging results. In addition to its impressive capabilities, 2010 offers user-friendly controls and intuitive menus for easier navigation and quick access to the information. It also features an automated image acquisition unit that can store up to 10 sample images for future reference and comparison. This machine is integrated with computer-controlled specimen loading systems for improved accuracy and speed. Overall, JEOL 2010 is a powerful scanning electron microscope offering high-resolution imaging and analysis capabilities, intuitive controls and user-friendly menus, and outstanding performance in all SEM tasks. The versatile instrument is ideal for applications in research and industrial settings, and can greatly improve the quality and accuracy of data collection and analysis.