Used JEOL 2010 #9374839 for sale

JEOL 2010 is a field emission scanning electron microscope (FE-SEM) designed for applications such as Materials Science, failure analysis, process control and biological research. This instrument's performance and flexibility meets the requirements of researchers working in a wide range of fields. 2010 has enhanced image clarity and resolution, clear color-coded mapping, and good depth of focus, and flexibility to work over a wide range of magnification and accelerating voltage. It offers an extended concentration range of acceleration voltages, from 0.1kV to 30kV, and high resolution imaging and fast image acquisition. JEOL 2010 has a higher throughput compared to prior generations, providing a high level of productivity. 2010's stage has a rigid construction and a highly stable mechanism, enabling high-speed imaging and high-precision XY scanning. With an extended scanning area and high throughput imaging, JEOL 2010 makes it possible to accomplish large field of view SEM inspections in a short time. 2010 can be used with a variety of detectors, including secondary and backscatter electron detectors, for the observation of different physical properties. The design and functioning of JEOL 2010 also provide expanded capabilities for imaging, providing a continuous range of 10-20,000x magnification. 2010 provides: high-fidelity imaging system; higher processing capability; extended range of acceleration voltage from 0.1kV to 30kV; excellent depth of focus; highly efficient and stable vacuum system; and extended concentration range of accelerating voltage. JEOL 2010 is also compatible with the latest image processing software. 2010 is an efficient, versatile,and high-performance FE-SEM that is well suited for a wide variety of experimental applications. Its compact size, excellent performance, and extensive range of capabilities make it an ideal choice for many research and laboratory fields.