Used JEOL 2010F #9283823 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
![JEOL 2010F Photo Used JEOL 2010F For Sale](https://cdn.caeonline.com/images/jeol_2010f_1245893.jpg)
![Loading](/img/loader.gif)
Sold
JEOL 2010F is a scanning electron microscope (SEM) that offers users capabilities ideal for a wide range of applications across many industries. The instrument is equipped with a range of advanced features, allowing both experienced and novice users to quickly and easily prepare samples for observation. The device has a large chamber size, enabling the user to observe larger samples - up to 12 cm in diameter. It is equipped with a FEG with a high brightness, allowing for good focus, contrast and resolution. Its non-magnetic fast switching polepiece technology provides high levels of performance, producing clear images and high stereo angles. The device includes a comprehensive range of detectors, including secondary and backscattered electron detectors. Its 4 quadrant backscattered electron detector produces high resolution images and can be used to measure small objects. It also has a secondary electron detector with a large solid angle, providing excellent efficiency and sensitivity. The system also boasts several analytical capabilities, making it suitable for a multitude of applications. Its energy dispersive X-ray (EDX) detector provides users with information about the composition and thickness of samples, making it possible to identify the elements present in the sample. Its EBSD (electron backscattered diffraction) detector is ideal for advanced crystallography, allowing users to analyze atomic structure, orientation and strain in individual grains and thin films. JEOL 2010 F offers a number of automated features, making it extremely user-friendly. Its automatic functions can be used to quickly set up experiments, saving users time and effort. It also has a scanning electron beam control, allowing the user to move or scan the sample with precision. Finally, its automated digital electronics provide excellent intermediate resolution. 2010F is an excellent scanning electron microscope, suitable for a wide range of applications. With its sophisticated features and automated capabilities, it is an ideal instrument for both professional and novice users alike.
There are no reviews yet