Used JEOL 2011 #293635455 for sale
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ID: 293635455
Vintage: 2001
Transmission Electron Microscope (TEM)
LaB6 Electron source
DP Vacuum system
HR Pole piece
OXFORD INCA 30 mm²
LN2 Detector
GATAN 622 TV Camera
GATAN 646 Double tilt holder and controller
Single tilt holder
Power supply: 80-200 kV
2001 vintage.
JEOL 2011 is a scanning electron microscope (SEM) with superior performance capabilities and is well suited for applications in the nanoscience, life science, and engineering fields. It is made by JEOL, a world leader in electron microscopy technology, and was released in 2010. 2011 offers a variety of features and advantages for its users. From its high-speed, high-resolution imaging to its energy-selective backscattered electron detection equipment, JEOL 2011 provides scientists and engineers with a powerful tool for characterizing and analyzing sample surfaces and structures. 2011 is equipped with an electron column consisting of a field emission gun (FEG), an in-lens detector, and a 2.5nm scanning spiral lens. This optimized electron optics system allows for high-resolution imaging, with a maximum resolution of 0.9nm. JEOL 2011 also features a high-speed imaging unit, capable of scanning up to 200 images per second. This enhanced imaging speed makes it possible to capture high-speed phenomena or fast physical processes. In addition to its imaging machine, 2011 offers a variety of analytical capabilities. The energy-selective backscattered electron (BSE) detector allows users to detect and measure differences in material composition and topography on the nanoscale. JEOL 2011 also features everhart-thornley (ETD) and solid immersion lens (SIL) detectors, allowing users to produce even higher resolution images than those possible with the standard BSE detector. Finally, 2011 is also equipped with a range of built-in automated functions and tools. This includes an automated navigation tool for efficient positioning of the microscope's viewing area, as well as automated image enhancement and analysis algorithms. Overall, JEOL 2011 is an advanced scanning electron microscope that offers researchers and engineers a comprehensive platform for high-resolution imaging and analysis of nanoscale structures and surfaces. With its sophisticated electron optics asset and automated functions, 2011 provides users with the ultimate platform for electron microscopy.
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