Used JEOL 2011 #9224590 for sale

JEOL 2011 scanning electron microscope (SEM) is a high-resolution imaging tool that allows for detailed inspection of specimens and the analysis of surface features in ultra-high detail. It is capable of producing magnifications of up to 500,000x with a resolution of <1.0nm and high depth of field for optimal imaging of three-dimensional features. The combination of features of this microscope makes it ideal for a wide range of applications, from low-bandwidth imaging of benign subjects to high-resolution inspection of industrial components. The microscope operates by scanning a focused electron beam over a sample, resulting in secondary electron, backscatter, or x-ray emission. The resulting signals are then amplified and projected onto a phosphor screen to produce an image. The intensity and positioning of the electron beam can be adjusted to emphasize different features or to observe different sample characteristics in an area. In addition to imaging capabilities, 2011 also offers a variety of analytical capabilities. These include quantification of surface features, compositional analysis, morphology, and crystallinity. In addition to these analytical functions, it provides a host of features to make operation and analysis easier, such as a tilting stage that allows for inspection of stepped features in a sample and an automated analysis routine. JEOL 2011 is a versatile imaging and analytical tool with a variety of features to allow for high-resolution inspection and analysis of a wide range of samples. Its combination of features produces usable, reproducible, and meaningful images of the relationships between surface properties and the underlying structure of a sample. With its host of features, 2011 can be a valuable asset in a wide range of research and industrial applications.