Used JEOL 2100 #9016184 for sale

Scanning electron microscopy (SEM) is a technique used to produce high resolution images of surface features of a specimen. JEOL 2100 is a type of SEM instrument that is used to analyze various samples for the purpose of determining their composition, morphology, and structure. 2100 features a field emission electron source that is used to generate a highly stable and bright beam of electrons. This beam is then directed toward the sample to be analyzed, which is mounted on a sample holder. As the electrons interact with the sample, they are scattered in various ways. Some of the interactions will result in the emission of additional electrons, which can be collected and used to generate a three-dimensional image of the sample. The voltage of the electron beam and the pressure of the surrounding atmosphere can be adjusted to achieve different levels of contrast in the image. JEOL 2100 also features an in-lens secondary electron detector, which is used to detect the emission of electrons from the sample. This is done with a detachable scintillator that is positioned in the column of the microscope. As secondary electrons are emitted, they pass through the scintillator, where they are converted into light. The light is then sent to an electron multiplier, which amplifies the signal and transmits it to the control unit of the microscope. The control unit then processes the signal and creates one or more images of the sample. 2100 is capable of producing images with a resolution of up to 2 nm. This allows for the visualization of very small features, such as individual cells, organelles, and proteins. Additionally, the microscope can be used to analyze both organic and inorganic materials. JEOL 2100 is an advanced SEM instrument that is used in a variety of applications, ranging from academic research to industrial quality control. The microscope's high resolution, versatility, and ease of use make it a valuable tool for anyone involved in analyzing samples.