Used JEOL 330 #9268274 for sale
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JEOL 330 is a scanning electron microscope (SEM) designed for high performance imaging from JEOL range of microscopes. It is a top-of-the-line equipment, capable of producing high-resolution images with a very high degree of precision and detail. Its main feature is its versatile range of imaging modes, which allow the user to explore the surface of a sample at multiple resolutions. It also offers a range of features for measuring surface topography and microstructure, as well as for life sciences imaging. 330 is equipped with an ultra-high resolution digital camera and dynamic scanning technology. This allows for detailed imaging of even the finest features on a sample's surface. It has a large, 8" diameter specimen stage, which is able to accommodate a variety of sample sizes. The microscope is also equipped with a secondary electron detector and a retractable backscattering detector. These detectors allow for the collection of both qualitative and quantitative data, making it suitable for a wide range of applications. The SEM also has an automated focusing system, which ensures extremely high resolution imaging. It also allows for the automated analysis of a range of different parameters. These parameters include the surface topography and its roughness, grain size distribution, and particle shapes and orientation. This makes JEOL 330 well-suited for a variety of microstructural, tribological, and failure analysis studies. In addition to the range of imaging capabilities, 330 also offers a variety of additional features. It has a high-speed scan capability, allowing it to generate images with a much higher rate of efficiency than other systems. It also has a patented virtual cliff unit, which ensures accurate imaging even on uneven surfaces. This makes it well-suited for exploring the surfaces of uneven and highly textured materials. Overall, JEOL 330 is one of the most capable and powerful instruments available for the study of surface features. It offers a high degree of precision, accuracy, and versatility, thanks to its combination of imaging modes and detectors. Its automated focus machine and high-speed scanning capability also make it suitable for a variety of applications.
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