Used JEOL 35 #126386 for sale

JEOL 35 is a scanning electron microscope (SEM) designed for high-precision imaging and analysis of a wide range of samples. It features a wide field of view, depth-of-field and resolution performance, with images that can be enlarged up to 2000x the original size. Its robust design makes it reliable and ideal for imaging samples in a variety of materials including metals, ceramics, polymers and organics. 35 is equipped with a low vacuum mode that provides rapid sample imaging and analysis capabilities. It is equipped with a field emission gun system that allows for precise sample size control with a high primary beam current from 0.5 - 5 nano-amps. This allows for imaging at various magnifications for maximum field of view and resolution. The SEM is equipped with a large variety of detector systems including secondary electron detectors and back scattered electron detectors for increased image contrast and improved depth of focus. JEOL 35 operates with an automated stage system that allows for the precise sample positioning and precise navigation to different areas of the sample. The stage provides a maximum movement range of 280mm x 280mm. It also features a large specimen chamber with a maximum size of 800mm x 800mm, allowing for imaging of large samples. The SEM is powered by a high speed digital imaging system that combines data from the detectors and electron optics to create digital images of the sample for further analysis. 35 also includes innovative software for image enhancement, manipulation and analysis. These are integrated features that provide features such as image segmentation, spectral analysis and line profile integration. This software allows users to make precise measurements, analyze data, and create 3D models. JEOL 35 is designed to allow users to make precise measurements, analyze complex data and manipulate images to extract the maximum amount of information from a sample. Its versatile design, robustness and high performance capabilities make it the ideal imaging tool for a variety of fields, such as materials sciences, mineralogy and geology.