Used JEOL 35 #9044656 for sale

JEOL 35 Scanning Electron Microscope (SEM) is a high-performance piece of equipment that utilizes an electron beam for observing the details of sample surfaces. The axis of the electron beam is focused onto the sample through the use of an electrostatic lens, while an energy analyzer equipment adjusts the intensity of the beam to achieve optimal image contrast. The sample is positioned on a top-loading stage and can be manipulated with three-dimensional control to properly orient the desired area for imaging. 35 SEM offers a wide variety of features and accessories, including a secondary electron detector, a backscatter electron detector, an automated general information system, and a EDS® tilt detector for 3D imaging and analysis. This cutting-edge equipment also allows users to employ special sample preparation techniques to properly examine various materials. Two of these techniques, called Cs-corrected imaging and low-vacuum SEM are dedicated for processing poorly conductive, fragile, or non-conductive samples. JEOL 35 SEM has outstanding resolution capability with a maximum resolution of 1.4nm. Additionally, its operation is remarkably quiet and low in vibration, making the environment around it suitable for spectroscopic analysis. Its operating and environmental conditions are also designed to be easy on the operating unit and on the maintenance components; thus, considerably reducing downtime. 35 SEM is a reliable, high-performance instrument that provides excellent resolution while ensuring the highest safety standards. Furthermore, the SEM's sophisticated imaging machine make it easily configurable for various analysis requirements. With its superb features, JEOL 35 SEM lays the groundwork for groundbreaking research and innovation.