Used JEOL 35S #9375350 for sale

JEOL 35S is a scanning electron microscope (SEM) with a large depth of field and a high resolution imaging capability. This instrument has a large field of view and provides high contrast images that can be used for precise measurements and analysis. The detection system has a high sensitivity and low noise floor allowing for accurate estimates of sample features and their sizes. The system can also accommodate a variety of sample types, including conductive and non-conductive materials, providing a broad range of imaging capabilities. The design of 35S is based on a column lens created from nickel/phosphor, an apochromat type, which was built for maximum resolution. It also produces no thermal distortion during microanalysis and provides high intensity at all magnifications. The primary electron source for JEOL 35S is a tungsten field-emission gun that can be operated in a variety of environments. A blanked acceleration voltage range of 1-30 kV provides for a wide dynamic range for imaging. The gun provides a low background current noise, making it possible to take images of small and detailed samples. The detector on 35S is an array of 12 secondary electron (SE) detectors consisting of an in-column deflector and an annular bright field (ABF) detector. The ABF detector provides high-resolution imaging at a wide range of magnifications while the deflector enhances contrast in images of non-conductive surfaces. Additional detectors are available including a backscatter electron detector (BSED) and a cathodoluminescence detector (CLD). JEOL 35S is equipped with a motorized stage that allows for movement of samples in the X, Y and Z axes for precise positioning. The software for the microscope is easy to use, featuring automatic focusing, contrast enhancement, and advanced image processing capabilities. 35S can also be used for microanalysis using its electron microprobe. It supports energy-dispersive X-ray (EDS) and wavelength-dispersive X-ray (WDS) spectrometry to measure elemental composition in addition to imaging. Overall, JEOL 35S has a high resolution imaging capability and can capture precise images from a variety of sample types. Its ability to accommodate in-column and annular detectors makes it suitable for different applications. Additionally, its software features and flexibility of sample manipulations make it a highly reliable and invaluable tool for any laboratory.