Used JEOL 4500 #9253502 for sale

A JEOL 4500 is an advanced scanning electron microscope (SEM) used for materials analysis and imaging at the micro and nanoscale. This scanning electron microscope is equipped with an energy-dispersive X-ray detector (EDS) that can measure wavelengths and chemical composition of elements on the sample surface. 4500 is designed to provide high resolution imaging for a wide range of materials. The SEM is equipped with a built-in dual-beam technology, consisting of a high-speed secondary electron (SE) detector and a lower-energy, higher resolving-power imaging detector. This combination makes it suitable for various high-resolution imaging techniques, such as line scans, secondary electron imaging, and backscattered electron imaging. The microscope also provides rapid imaging speeds and a semiautomatic focus system to reduce operator fatigue and increase operator accuracy. JEOL 4500 offers a maximum imaging resolution of 2 nm, making it ideal for capturing structures in detail, including thin films, nanowires, and integrated circuits. The SEM is also equipped with a high-sensitivity EDS detector that can detect trace elements down to parts-per-billion concentrations on the sample surface. Compared to conventional SEMs, 4500 offers improved electron gun filament lifetime, with a typical lifetime of up to 4000 hours. This extends the time between maintenance and preserves the instrument's stability over long periods of use. The SEM also features a patented field-emitter design for higher current densities, resulting in higher electron yields and reduced beam blurring. Operating JEOL 4500 is easy thanks to its built-in automation features, such as its scan sequence setup, freeze-frame acquisition, motorized stage control, and auto-focusing. The microscope is also equipped with a high-sensitivity digital computer for storing user settings and image data. The digital computer is also used for controlling measurement parameters. Overall, 4500 is an advanced scanning electron microscope for materials analysis and imaging. It offers improved resolution and accuracy compared to conventional SEMs, along with automated features and a long-lasting electron gun filament for extended periods of use.