Used JEOL 5310-LV #293600950 for sale

JEOL 5310-LV is a scanning electron microscope (SEM) designed to produce high-resolution images of samples. It utilizes a high-energy electron beam to gain detailed information on a sample's surface characteristics, such as size and shape, elemental composition, and material microstructure. JEOL 5310LV has a large chamber, creating an excellent work environment for users. The chamber is equipped with a diffusion-pumped, high-vacuum system, ensuring a very stable environment to improve image clarity and reduce e-beam irradiation damage. The chamber also features a cold stage, which enables users to analyze samples at low temperatures. Low temperature analysis preserves sample integrity and reveals additional image detail. The closed chamber design minimizes sample contamination, while allowing users to observe the entire objective surface without the need to rotate the sample. 5310-LV uses a 200 kV electron beam and offers a selection of lenses to generate images between 0.7-200 μm of resolution. This highly fine-tunable electron beam allows users to visualize samples in various imaging techniques such as single/double axis tilt, low angle, secondary and backscattered electron imaging, and X-ray microanalysis. 5310LV is equipped with a wide array of detectors to obtain chemical and morphological information from samples. JEOL 5310-LV is an easy to use SEM. It is equipped with iOS, Windows and Android compatible software for imaging, and offers a simple user interface featuring an intuitive assistance system. The system makes it easy for users to select and adjust imaging parameters, such as brightness and contrast, as well as filters, detector current, and resolution settings. JEOL 5310LV is an excellent choice for professionals in academia and industry, who require superior performance, high resolution imaging, and reliable operation. Its sophisticated design and superior performance make 5310-LV an ideal tool for a wide range of applications, such as polymeric, ceramic, and semiconductor materials research.