Used JEOL 5310 #9071905 for sale

JEOL 5310 scanning electron microscope (SEM) is a high-performance, yet compact microscope designed for research and industrial use. This SEM combines high resolution imaging capabilities with advanced analytical technology for an optimized imaging experience. 5310 features a large depth-of-field for exceptional depth profiling and imaging, allowing users to capture clear images of small objects or intricate structures. The unit's SEIS (Secondary Electron Imaging Equipment) ensures a high image contrast and smooth image uniformity. This system is also capable of capturing signal information from deep within sample structures, providing superior resolution even when working with composite materials. The microscope is equipped with an in-lens detector unit, which supplies information about specimen topography and composition. This feature, combined with a built-in auto-focusing machine, helps ensure accurate measurements and precise imaging. The SEM's auto-focusing tool also is capable of compensating for the sample surface movement and particle motion. Another notable feature of JEOL 5310 is its high speed scanning and low noise performance. This ensures a low acquisition time, while maintaining a high resolution imaging window. This asset also offers a wide range of analytical techniques for quanta analysis. 5310 is an ideal choice for industrial, academic, and research applications. It provides a powerful platform for a range of applications, including materials analysis, failure analysis, tribology, and metallography. With its intuitive user interface and automated features, this microscope makes it easy to capture precise images quickly. The SEM's powerful imaging capabilities, in combination with advanced analytical techniques, make it an invaluable tool for a variety of industries.