Used JEOL 5310 #9200586 for sale
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ID: 9200586
Scanning electron microscope
High vacuum operation:
With diffusion pump & roughing pump
HASKRIS Water chiller included for diffusion vacuum pump
With diameter 10 ft water interconnect hoses
Polaroid film camera
With digital camera system similar to astronomical camera
Basic technical & mechanical parameters:
Magnification: 35x - 200000x
Working distance: 8 mm to 48 mm
Specimen size:
Diameter: 72 mm (Maximum)
Height: 40 mm (Maximum)
Specimen goniometer stage: X, Y, Z, Rotation
Control: Manual
X-Y: 38 mm x 70 mm
Tilt: -10° to ～＋70°
Rotation: 360°
Operates on 120 VAC
Console measures:
Length: 62
Depth: 30
Height: 48
OXFORD Energy dispersive X-ray spectroscopy
Includes:
Manuals
Hardware / Cabling
Tran slink
Electron gun filaments
Basic PC's are included with adaptors & cables
Not included: Software
Power: 0.5 kV to 30 kV.
JEOL 5310 is a high-performance scanning electron microscope (SEM) that can be used for a variety of research purposes. The SEM is perfect for both single and dual beam energy dispersive X-ray spectroscopy (EDS and EBSD). In addition to the high-resolution imaging capabilities and their comprehensive analysis, this instrument is suitable for probing a wide range of materials. 5310 SEM has an emission current of 0.05 to 5 nanoamperes and a wide multiple secondary electron detection range. With heavy current adjusting knob and port extension it can detect and quantify a variety of features. It features an accelerated voltage of 2, 3, 5, 8, 10, 15, 20 and 30 KV. This SEM can also be used for pixel and line scan image recording along with for various image processing and analysis. In order to make the SEM operate in a stable manner, it has been equipped with an auto tune system that can detect fast changes. This allows the user to stay in touch with the current and real time image quality and image path. The maximum resolution of JEOL 5310 is 0.25 nanometer with a large field of view of 3.8 cm x 3.8 cm while it features an improved electron optical system that supports a total of six different objective lenses. 5310 offers a large selection of accessories, such as polarization filters, crescent fields and different types of detectors, enabling the user to configure the machine accordingly. Analytical capabilities of JEOL 5310 include EDS and EBSD for qualitative and quantitative analysis and STEM for elemental mapping and line scans. The current addition of a special low voltage detector makes is possible to acquire very high resolution images at shorter accelerating voltages than what is achievable with a standard SEM. Finally, 5310 has a software package for conventional image processing and image analysis, including scanning electron microscopy, STEM imaging and electron diffraction. Therefore, JEOL 5310 is a perfect instrument for material research and in particular for studying biomineralization and nanostructured materials.
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