Used JEOL 5600 #9157311 for sale

JEOL 5600 is a scanning electron microscope (SEM) designed for the investigation of a material's surface morphology and microstructure due to its high resolving power. The microscope is equipped with a monochromated tungsten filament source optimized for samples with low conductivity. Its maximum accelerating voltage is 30 kV and has a limited working distance of 4mm. 5600 SEM also has a small spot size of 0.8nm for high resolution imaging. It is equipped with an Everhart-Thornley (ET) detector for energy dispersive X-ray (EDX) analysis and a secondary electron (SE) detector for image acquisition. With a field of view of up to 230nm at a resolution of 4mm/mrad, this microscope can be used for high-resolution imaging and analysis of inorganic and organic materials. JEOL 5600 is designed to provide quantitative image analysis specifically for semiconductor devices, such as transistors, diodes and C-MOS circuits. The SEM is also capable of performing elemental analysis with an EDX detector, providing accurate mapping and quantitation of material composition and chemical state of the elements within sample up to elements at atomic mass numbers beyond 200. In addition, 5600 is equipped with a series of detectors for transmission electron microscopy (TEM), which can be used to measure the thickness of thin films and measure the grain size of polycrystalline materials. Furthermore, in-situ melting and annealing processes are possible with the help of a resistive heating system which utilizes an electron beam to heat up sample up to 1000˚C in a vacuum. Furthermore, JEOL 5600 employs digital image processing technologies and a computer control system which enable fast data processing and high-precision image reconstruction. It also has an optional accessories such as a digital signal processor (DSP) and parallel port for high-speed data acquisition. Overall, 5600 is a powerful scanning electron microscope that is capable of performing microstructural analysis of organic and inorganic samples. Its high resolution imaging, EDX analysis, and TEM capabilities make it a versatile and advanced SEM, and is highly reliable and accurate for scientific and industrial research.