Used JEOL 6340F #9139647 for sale

JEOL 6340F
ID: 9139647
Wafer Size: 6"
FE scanning electron microscope (SEM), 6".
JEOL 6340F is a high-performance scanning electron microscope (SEM) designed with enhanced imaging capabilities and an extensive suite of analytical tools for use in industrial, scientific, and education applications. With a high-performance EDS system and integrated EBSD detector, this SEM provides high-detail images and accurate analytical results with improved material characterization. JEOL 6340 F includes a 50kV field-emission gun that is capable of achieving higher resolution images and improved imaging speed, with greater depth of field and contrast. The specimen stage is kept motionless with low vibration frequency, offering improved imaging accuracy and the possibility of higher magnification levels. The chamber offers a maximum sample size of 150mm, with a rotatable stage and a specimen capacity of approximately 12kg. The chamber is also equipped with a liquid nitrogen-cooled chamber for low-kV imaging, providing excellent image quality in order to facilitate analysis of delicate or challenging samples. In addition to its superior imaging capabilities, 6340F includes a suite of analytical tools that allow for accurate elemental and surface analysis. The SE imaging mode allows for a wide range of signal spectral to provide complete chemical element information, with the secondary electron imaging allowing for elemental mapping to achieve greater sample detail. The electron backscatter diffraction (EBSD) allows for surface characterization and for measurement of grain boundary and other properties in metals, ceramics, and cements. The EDX mode offers improved detection accuracy and sensitivity, with a single atom resolution. Furthermore, numerous detectors can be integrated into the chamber to extend capabilities, such as energy-dispersive X-ray spectrometry, X-ray diffraction, and laser-induced breakdown spectroscopy (LIBS). All of these analytical capabilities enable 6340 F to provide a comprehensive range of characterization and analysis performance, making it an ideal tool for materials science and industrial applications.
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