Used JEOL 6400F #9071901 for sale

Name: JEOL 6400F
Brand: JEOL
SKU: 9071901
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

JEOL

Model

6400F

ID: 9071901

Wafer Size: 6"

Scanning electron microscope, (SEM) 6" Wafer loadlock Chamber system Secondary and backscatter imaging Specimen stage: Type: Fully eucentric goniometer stage X-direction: 100 mm Y-direction: 110 mm Z-direction: 34 mm Tilt: -5° to 60° Rotation: 360° endless Working distances: 5 - 39 mm Specimen holder for 12.5 mm diameter x 10 mm height Specimen holder for 32 mm diameter x 20 mm height Specimen exchange: By airlock up to 150 mm diameter specimen holders By stage drawout 200 mm diameter or larger holders Absorbed current measuring terminal: built-in Specimen protection buzzer: built-in.

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JEOL 6400F is a next-generation scanning electron microscope (SEM). This instrument is a versatile tool that can be used for a variety of nano-scale imaging and analytical applications. 6400F uses an electron source to generate a beam of electrons which is then focused and manipulated to create an image of the sample surface. This highly reliable and sensitive instrument offers the advantages of high resolution imaging, high throughput analytical operations, and ease of use and maintenance. JEOL 6400F is equipped with a variable pressure, water-cooled electron gun. This allows users to adjust the operating pressure of the chamber, helping to minimize unwanted surface charging and provide accurate sample imaging without the need to adjust the acceleration voltage. The gun can reach a maximum acceleration voltage of 30kV, and is able to focus the electron beam into a spot with a diameter of 25 nm. A variety of detectors are included with the SEM, including: secondary electron detector, back-scattered electron detector, energy dispersive X-ray spectrometer (EDS), and wavelength dispersive X-ray spectrometer (WDS). The EDS system can be used for elemental analysis, while the WDS system can be used for more precise chemical analysis. In addition to imaging and analytical operations, 6400F has several other features that make it an ideal tool for nanotechnology research. It includes a stage that can be manually or automatically controlled, allowing users to rotate, tilt, or move samples in order to image different areas of interest. It also includes automated image processing and operation software that can help researchers accurately and quickly acquire data needed for analysis. JEOL 6400F offers excellent resolution and high stability, making it an excellent instrument for nanotechnology research. It is an easy to use instrument, and its various features make it versatile enough to be used for a wide array of applications. Its analytical and imaging capabilities surpass those of conventional microscopy tools and can help researchers gain valuable insights into the nanoscale world that traditional techniques cannot access.