Used JEOL 6400FV #9071902 for sale

JEOL 6400FV
ID: 9071902
Field Emission Microscope (FEM) Secondary and backscatter imaging Specimen chamber cold-finger.
JEOL 6400FV Scanning Electron Microscope (SEM) is an advanced microscope with many features and capabilities. 6400FV is an advanced equipment designed for research in a variety of fields from forensics to materials science. JEOL 6400FV is equipped with secondary electron imaging and backscattered electron imaging, enabling high-resolution capabilities for a variety of specimens. It is also designed for both standard and variable pressure operation, and features 4-quadrant backscatter detectors for enhanced characterization capabilities. In addition, the specimen chamber is equipped with multiple tilt angles and specimen boundaries for various SEM applications. 6400FV has a new EDS (Energy Dispersive Spectrometry) detector that provides a better data quality due to its large active area and high count rates. It also features a "fixed window" area which reduces the time needed for EDS data acquisition and increases throughput. Furthermore, this instrument offers advanced automation and computer verification system that simplifies unit setup. JEOL 6400FV has a digital camera and computer controlled software for data acquisition and analysis. The camera provides images at resolutions up to 5,120 x 3,840 pixels with a 16-bit color depth, providing a full range of colors and details. The computer controlled software can process the images and store them on any computer format. The imaging capabilities of 6400FV are further enhanced by its variable chamber pressure of up to 10-2 mtorr. As well, JEOL 6400FV is designed to operate with evaporators for coating of samples with thin films and for depositing material. The advanced machine also features a high vacuum mode which is ideal for low background imaging. 6400FV is an advanced tool that offers a wide range of capabilities for advanced research. The electronic imaging and advanced automation capabilities enable users to achieve a variety of tasks including materials characterization, forensics investigations, and thin-film deposition. Furthermore, the variable pressures, digital cameras, and computer controlled software all combine to create an advanced SEM that is ideal for a variety of applications.
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