Used JEOL 6480 #293651583 for sale

JEOL 6480 is a scanning electron microscope used for material analysis and inspection. It offers high image resolution and a wide range of analysis capabilities. The microscope is designed to allow high-sensitivity imaging and trace analysis even in difficult surfaces. At the heart of the microscope is the field emission gun (FEG) electron source, which eliminates spark gaps and electrical noise, enabling high resolution imaging with low voltage operation. The FEG also allows variable beam current and electron acceleration potential to be used, giving significant flexibility in imaging and analysis techniques. 6480 operates in SE, BSE, and EDS mode, enabling the user to perform a wide variety of studies. SE (secondary electrons) imaging is useful for low magnification studies of the specimen surface, BSE (back scattered electrons) imaging is well suited for long range contrast level imaging and topography, and EDS (energy dispersive spectroscopy) provides elemental composition information. JEOL 6480 also features a unique high-definition contrast variation function which allows users to optimize the contrast level of the images being viewed. The variable contrast control also permits users to select multiple contrast enhancements and save them for future use. In addition, 6480 also has an automated object-based 3D imaging package, which allows fast and accurate 3D reconstructions of the specimen. This feature is particularly useful for detailed analysis work. JEOL 6480 has a working range of 1nm-, allowing for extremely high resolution imaging. It has a magnification range of up to 100,000x and a field of view of up to 50,000x, with the ability to capture images and video at up to 27 frames per second. Finally, 6480 is capable of multi-modal imaging, meaning that it can combine images from multiple imaging modes in a single image. For example, it can combine SE, BSE, and EDS images of the same specimen in a single image, allowing for rapid and detailed analysis of samples.