Used JEOL 6490LV #293671640 for sale

JEOL 6490LV is a high-performance scanning electron microscope (SEM) that is designed to provide an array of analytical capabilities for research laboratories. It offers significant advantages for a wide range of applications including in situ analysis, failure analysis, circuit analysis, metallography, and 3D imaging. 6490LV is equipped with a JED 2421 variable pressure/high vacuum equipment that allows both high vacuum and variable pressure operation. This enhances the accuracy of imaging and analysis results as it reduces beam drift and ensures superior image quality under all operating conditions. JEOL 6490LV is fitted with a low-absorption W-type filament detector that provides sharp images and provides a greater field of view with larger apertures. It has a magnification range of up to x500000 and a lateral resolution of 3 nm, yielding excellent imaging performance and enabling detailed analysis of objects. The high-throughput design of 6490LV enables quick scanning of large areas while maintaining excellent high-resolution imaging. It is equipped with an automated electron beam control system, which allows users to quickly set up their experiments, scanning parameters, and image modes. The detector design of JEOL 6490LV is capable of supporting advanced detection techniques such as energy-dispersive X-ray spectroscopy (EDS). Additionally, 6490LV is equipped with a digital imaging unit which provides instant access to detailed, clear images. Overall, JEOL 6490LV is a highly advanced scanning electron microscope that facilitates precision analysis of a wide range of samples. Its many advantageous features, including its variable pressure/high vacuum machine, low absorption W-type filament, and automated electron beam control tool, make it a durable and reliable tool for efficient SEM applications.