Used JEOL 6500F #9234597 for sale

JEOL 6500F Scanning Electron Microscope (SEM) is one of the most advanced instruments in the field of electrons microscopy. It uses a focused beam of electrons to produce detailed images of the surface properties and topography of samples. The SEM is capable of providing high resolution images of samples, ranging from 1 nanometer to 100 micrometer in size. 6500F is equipped with a Schottky field emission gun that allows for ultra-high vacuum operation and excellent beam stability. This gun is also capable of providing high current electron emission capabilities by maintaining a constant beam current. The instrument also features an advanced high speed scanning system that allows for fast scanning and image acquisition. JEOL 6500F is also equipped with a wide range of detectors optimal for different applications such as Secondary Electron (SE) detectors, Low and High Vacuum- Back Scattered Electron (BSE) detectors, and an Electron Gun Detector (EGD). This enables collection of different types of electron images and spectroscopic data from samples. The high vacuum systems provided with the instrument ensures minimal beam damage to the sample surface. This electron microscope features a wide array of image analysis software that can be used to compare and contrast images or obtain quantitative analysis in both two and three dimensions. In addition to conventional imaging modes, this SEM also offers unique imaging capabilities such as in-lens optical imaging, cathodoluminescence, phase contrast imaging and electron-beam induced electrostatic contrast imaging. 6500F is equipped with a wide collection of accessories and peripherals to meet the needs of many applications. This includes a XYZ automated stage, image manipulation modules, environmental chambers, vacuum systems and sample pre-treatment devices. The instrument also features a robotic sample manipulation system for automated sample handling and a low pressure immersion cell for examining samples at higher pressures. The combination of its features and capabilities make JEOL 6500F an extremely versatile instrument for a wide range of applications, from the study of organic and non-conductive materials, to the characterization of nano-devices. This SEM offers exceptional performance and versatility for imaging and analysis.