Used JEOL 6701F #9077186 for sale

JEOL 6701F is a scanning electron microscope (SEM) designed for a variety of imaging applications. It has a field-emission cold-cathode electron gun to generate a highly focused beam of electrons, which is then scanned across the specimen in a raster pattern at a high velocity. The beam of electrons interacts with the specimen and the secondary electrons generated from the specimen's surface are then collected to form a digital image of the specimen. This SEM has a maximum accelerating voltage of 30kV, so high-resolution imaging can be achieved even for very thin specimens, as well as for light elements. The beam divergence is only 1 mrad, which provides the extremely high resolution of up to 1Å. The accuracy of the image and depth of field is also improved by the unit's large collection angle of up to 50mrad. The electron beam generated by 6701F is not only focused but also stabilised using the optical beam stabiliser (OBS). This system maintains a stable beam diameter and cross-section to ensure image sharpness and resolution. The unit also has a range of advanced imaging modes, enabling activities such as elemental characterisation, e-beam lithography and free-and-contact-mode imaging. Its omegascan Automatic Scanning System (ASS) facilitates the rapid acquisition of topographic images as well as nano-omiting, which offers the highest resolution on the market. Additionally, JEOL 6701F includes automated sample manipulation. Its sample handling system automatically runs the sample through routine actions such as loading, orientation, alignment, and focusing. The auto-standby feature further reduces operation time. All these features, along with 6701F's superior performance, make it an ideal SEM for researchers in diverse fields such as materials science and microelectronics.