Used JEOL 7100FLV #9315317 for sale

JEOL 7100FLV is a high performance scanning electron microscope (SEM) that combines advanced technology with ease of use. It is a vertical scanning electron microscope that uses a field emit gun and ultralow voltage (ULV) electron optics to produce super high resolution images. It is capable of producing both high-resolution scanning electron microscopy (SEM) images and transmission electron microscopy (TEM). The electron beam of 7100FLV is generated by a field emit gun, which provides greatly improved resolution and maximum transmission, allowing for the production of high-resolution images. This is in contrast to traditional SEMs with a cold cathode gun, which suffer from significant motion blur that can negatively affect image resolution. The ULV optics of JEOL 7100FLV further improves the resolution of the SEM, enabling observation and analysis of extremely small features. 7100FLV is also capable of a wide variety of imaging modes. These include the standard bright field (BF) and dark field (DF) imaging modes, as well as the correlative light microscope (CLIM). This allows for correlation between SEM and optical microscopy for multi-dimensional analysis. Additionally, using a wet reference sample holder, one can place wet samples in the SEM chamber for analysis. JEOL 7100FLV also includes a computer interface with an easy-to-use software package which allows for images to be captured, zoomed, rotated and analyzed. This package also includes powerful image processing and analysis software to enable a wide range of analysis and measurement. 7100FLV is an ideal choice for scientists and researchers in a variety of fields, particularly those requiring imaging of small features. This SEM provides excellent resolution and a wide range of imaging features with an easy to use software interface, making it a powerful instrument for even the most complex imaging work.