Used JEOL 7200 #9274854 for sale

JEOL 7200 is a scanning electron microscope (SEM) that is often used in a wide range of analytical and research applications including biological, polymer, mineral, and materials research. The SEM operates in three distinct modes of operation; secondary electron imaging (SEI), backscattered electron imaging (BEI) and energy dispersive X-ray detection (EDX). 7200 provides excellent imaging of specimens which further allows for mapping and elemental analysis of compositions of the sample. The SEM has an automated vacuum equipment for treating the sample and a high electron beam current resolution for better imaging. The integrated environmental and analytical systems also provide superior chromatography features, such as elemental micro-analysis and gas chromatography. JEOL 7200 has a wide resolution range that is suitable for a variety of specimens; it has a detector system that uses an automated image sampling unit and automatically sets the scan area and magnification. The SEM also features a field emission gun and imaging electronics; it is equipped with an ultrahigh-fidelity electron gun emitters, high-stability scanning deflector, and coupled with digital electronics for electron beam control. 7200 SEI mode can be used to capture true color images of specimens. The BEI mode can be used to measure surface roughness, porosity and structural textures of specimens. The EDX mode allows for elemental analysis of the sample. The integrated gas chromatography machine further provides superior analysis capabilities for research applications. JEOL 7200 provides superior imaging and analytical capabilities for research applications. It also features a high resolution electron beam viewing tool, electron optics capable of operating at up to 150kV, and a precise 3-axis nanometer stage. The SEM is used for a range of scientific research applications such as studying element distributions in microstructures, performing organic and inorganic elemental analyses, or studying the surfaces of material samples.