Used JEOL 7400 #9399277 for sale

JEOL 7400 scanning electron microscope (SEM) is an industry-leading device for imaging and analyzing surface morphologies. It is one of JEOL advanced and powerful microscopes, combining outstanding performance with cutting-edge features. 7400 is capable of acquiring high-resolution, high-sensitivity images, while providing precise control over the environmental conditions during observation. JEOL 7400 is a field emission SEM and includes an incorporated fine-focus electron source, high-accuracy beam current control, and low charging current emissions. This SEM operates at temperatures ranging from -100 °C to 100 °C, providing versatile imaging of biological and non-biological samples. Additionally, it is capable of generating high-resolution imaging and analysis of non-conducting samples using environmental SEM technology. With its large 21.3 cm (W) x 19 cm (H) field of view and 3nm resolution, 7400 offers high-resolution imaging and precise 3D sample analysis. It features the highest-resolution imaging, boasting 50nm resolution, semi-automatic sample transfer, and an intuitive user interface. Additionally, this SEM requires minimal maintenance, boasts excellent low accelerating voltage performance, and offers low cost of ownership. JEOL 7400 provides a variety of additional features, including image manipulation and analysis capabilities, live imaging, high-resolution secondary-electron detail imaging, and special operational modes for producing crystalline structures. Its proprietary magnification system also makes it possible for 7400 to achieve up to 500,000x magnification without any distortion of the observed sample. Furthermore, this SEM is capable of acquiring a wide range of magnifications in a single exposure, allowing for efficient use of the imaging system. JEOL 7400 scanning electron microscope provides unmatched performance, providing high-resolution imaging with precise 3D sample analysis. Its intuitive graphical user interface, semi-automatic sample transfer, and optional environmental SEM technology offer scientists improved performance and efficiency. With its proprietary magnification system and advanced imaging capabilities, 7400 enables accurate observation of a wide range of samples.