Used JEOL 7400 #9410397 for sale

JEOL 7400 is a Scanning Electron Microscope (SEM) system carefully designed to provide reliable high resolution imaging and analysis of materials in a wide range of applications. This SEM is equipped with a field emission (FE) gun and a column with a tilted specimen stage that can handle a wide range of samples, including fragile objects. This SEM is designed with an electron gun that has high stability, a large depth-of-field and low background noise, as well as a large specimen chamber to accommodate different sample sizes. 7400 is capable of imaging large structures at high magnifications and its X-ray analysis provides excellent chemical composition information. It also offers accurate secondary electron imaging at small beam currents, making it well-suited for imaging delicate samples. JEOL 7400 has an electron optics arrangement that includes an in-column aperture diaphragm to allow a full range of beam currents from nano-amperes to milli-amperes. It also has an in-column objective lens for a range of magnifications up to 50000x. The electron source has a lifetime of 30,000 hours, ensuring the highest performance and accuracy for long time studies. 7400 is a versatile and powerful SEM which offers a combination of excellent imaging, a large depth-of-field and incorporation of in-column detectors for X-ray spectroscopy. This SEM is designed to provide reliable and accurate results on a wide range of materials. This makes it an ideal instrument for biological, geological and metallurgical analysis.