Used JEOL 840 #293618108 for sale

JEOL 840 is a scanning electron microscope (SEM) designed for users looking for advanced imaging technology. It delivers a top-notch imaging performance and offers a wide range of capabilities ideal for researchers carrying out both routine and sophisticated imaging applications. With its powerful SEM package, users are able to perform fast and reliable imaging for versatile sample types and a wide array of sample thicknesses. This instrument also features an innovative Wien Filter Spectrometer (WFS) capable of: fast and reliable elemental analysis, EDS with full-spectrum imaging, automatically measuring composition at each pixel rapidly and accurately, and image-by-image elemental mapping of the sample. 840's SEM package consists of a field emission Everhart-Thornley gun with 4:1 TV contrast, a low angle annular dark field detector and a five-fold pole piece proven to prevent any astigmatic aberration. The SEM also has a wide range of high-end electron optics, including backscattered electron detector (BSD), secondary electron detector (SED), and a low voltage secondary detector (LVSD). It is capable of acquiring high contrast images with an extremely low noise level, delivering excellent electron optical performance and an excellent signal-to-noise ratio. The WFS combined with the SEM package allows users to instantly collect simultaneous full-spectrum and elemental information with ultra-high resolution for elemental analysis and elemental mapping. The WFS is equipped with an innovative ultra-fast spectrometer that enables the rapid acquisition of spectrum and X-ray diffraction information from the same shot. In addition, the instrument is pre-programmed with a wide range of materials, while the radiation detector provides excellent image resolution with X-ray signals acquired up to 12kV with reference information stored for every imaging run. JEOL 840's software environment is optimized for high-speed, reliable imaging and data analysis. It includes a user-friendly imaging interface which includes an array of powerful IQ and 3D reconstructive imaging techniques. Along with these imaging techniques, the touch-screen interface also allows rapid image transfer and export of datasets with excellent information reliability. Overall, 840 is an advanced imaging technology which combines the best in modern SEM packages with the ultimate in electron optics and WFS capabilities. It provides fast, reliable imagig and elemental analysis, excellent image resolution and high contrast images with extremely low noise levels. Ideal for routine and sophisticated imaging applications, JEOL 840 is the perfect companion for researchers looking to get the best in electron microscopy performance.