Used JEOL 840 #9068026 for sale

JEOL 840 Scanning Electron Microscope (SEM) is one of the highest-performing and most reliable SEMs available. 840 Scanning Electron Microscope has a number of features which make it a powerful and versatile tool for scientific research. First, JEOL 840 SEM equipment utilizes cold field emission combined with a cesium-based aberration corrector to achieve unparalleled sub-nanometer resolution. This allows for the highest-resolution imaging available, with an average resolution of 0.5nm and an ability to produce magnifications up to 100,000 times greater than the actual size of the sample. 840 system is also equipped with a highly-sensitive Energy Dispersive X-Ray (EDX) unit that can detect very small concentrations of elements with exceptional accuracy. This feature is especially valuable for chemical analysis and element mapping, due to its high signal-to-noise ratio. The SEM also has a diverse range of features for specimen manipulation. This includes an ultra-stabilized platform, a fast scan speed (up to 5000 frames per second), a SkelVac vacuum machine, and the ability to tilt the specimen for angle-specific imaging. Finally, JEOL 840 is also compatible with advanced automated acquisition and analysis software for both image and pattern processing. This includes advanced image enhancement algorithms, such as 3D reconstruction and statistical image analysis. The advanced features of 840 SEM tool make it the ideal choice for scientists needing a powerful and versatile tool for a wide range of applications. These include material science, semiconductor device fabrication, life sciences analysis, and forensic investigations. With its superior resolution, speed, and ease of use, JEOL 840 Scanning Electron Microscope is a reliable and powerful choice for a variety of research and industrial needs.