Used JEOL 840 #9071898 for sale

JEOL 840
ID: 9071898
Scanning electron microscope, (SEM).
JEOL 840 is a scanning electron microscope (SEM) designed for versatile applications, providing high resolution imaging and analysis in many diverse fields of study. The compact design, state-of-the-art optics, and advanced features manufacture superior images of small particles with extremely high magnification. 840 has a variable pressure chamber design that can scan samples at various levels of pressure, ranging from high vacuum to low vacuum, allowing for ultra-fast processing times. This feature eliminates the need for multiple systems in the lab, reducing operating costs. The SEM is fitted with advanced secondary electron and backscatter detectors, providing high-resolution imaging and detailed analytical capabilities. In addition, the optical system is designed with a high-sensitivity backscattered electron detector to provide up to 2.5 orders of magnitude better imaging performance than traditional SEMs in the field. The versatile design also has the capability to acquire and analyze spectra from EDS (energy dispersive spectroscopy) or X-ray mapping for elemental analysis. With its ability to rapidly switch between imaging and analysis modes, users can quickly view and process data in real time. The high-end digital optics and ergonomic design reduces the time required to obtain SEM images, resulting in faster sample preparation. The system can be easily operated and monitored with an intuitive touch screen user interface, providing an easy and informative overview of the analytical process. The system is also equipped with a laser auto focus feature which provides focus quickly and accurately. This feature shortens the time required to get ready for imaging data acquisition. JEOL 840 is also capable of producing high-resolution videos, allowing analysts to capture multiple frames and animate the sample to generate 3D datas from a single capture. In sum, the advanced features, high-end optics and intuitive interface on 840 make it an ideal instrument for operating in both laboratory research and industrial quality assurance environments. It enables analysts to collect high-resolution images and analytical data quickly and efficiently, making the SEM an invaluable asset in maximizing performance.
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