Used JEOL 840 #9242612 for sale

JEOL 840 is a scanning electron microscope (SEM) designed to provide powerful imaging capabilities in a variety of research applications. 840 combines an electron gun, field emission gun and an electron column to produce high resolution digital images of minute surface features. The high-transmission electron gun produces electrons that are accelerated and focused onto the sample. This enables imaging at a wide range of magnifications, from low to very high, which allows the user to distinguish fine details. The field emission gun is ideal for analyzing the composition of materials. It accelerates electrons at a much lower energy level, allowing it to detect trace elements and concentrations. The electron column contains many components that enable JEOL 840 to accurately position and move the electron beam. The column contains a scanning coil assembly, pre-analysis optics and vacuum chambers. The coil assembly consist of vibration dampening coils that allow ultra-fine adjustment of the beam's path and alignment. The pre-analysis optical system enables fine control of the beam size, current and the thickness of scanned area. The entire assembly is contained within a vacuum chamber to reduce potential contaminants. 840 is a powerful instrument for obtaining reliable images. The digital images are able to be very easily stored, communicated and shared. This SEM system has a number of user-friendly features, making it easy to operate and produce images of the highest fidelity. With its ability to image a variety of samples, it has become an essential tool for industrial and research applications.