Used JEOL 840A #9157331 for sale

JEOL 840A is a scanning electron microscope (SEM) utilized in many material science and industrial applications. It features an intermediate vacuum triple beam equipment composed of a focused ion beam (FIB), secondary electron (SE), and backscattered electron (BSE) detectors. The SEM analysis produces high-resolution images at magnifications up to 100,000x. Furthermore, the SEM images are capable of rendering surface morphology, elemental concentrations, or crystal structure. 840A is designed with an S/TEM (scanning/transmission electron microscope) dual column configuration for versatility. This allows for high resolution imaging of electron transparent samples, as well as conventional scanning electron imaging. The wide intermediate vacuum chamber is compatible with both gas field emission and thermal field emission sources, and has several gas lines and inlet lines for both SE and BSE mode. Furthermore, JEOL 840A offers an optional fully automated FIB prepared SEM imaging feature, allowing for the possibility to acquire electron transparent images and FIB prepared samples for SEM imaging. 840A offers advanced features, such as on-axis and off-axis film thickness and composition measurement, a sample scanning auto recognition system, annular detectors, variable pressure operation, and digital image simulation capabilities. Several of the SEM's advanced features allow for quantitative analysis of sample structure. The on-axis measurement unit measures material thickness during real-time imaging, while the off-axis detector measures the elemental composition of the sample at an accelerated sample rate. In addition, the SEM provides automated image registration and auto scanning feature for hands-free sample analysis. JEOL 840A employs an image process machine and software to digitize, store, process, and store the SEM analysis data. Furthermore, the tool offers brilliant post-processing capabilities, including measurement processing, element mapping, layer mapping, image processing, and 3D reconstruction. In conclusion, 840A is a versatile, advanced scanning electron microscope capable of high resolution imaging and advanced features. It is capable of providing detailed surface and elemental analysis of a wide range of samples, and is suitable for a variety of industrial and material science applications.