Used JEOL 845A #9157332 for sale

JEOL 845A is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide variety of materials. It utilizes an energy dispersive X-ray detector (EDS) and a high-resolution secondary electron detector (SE) to provide superior imaging and analysis capabilities. SEMs such as 845A, enable researchers to acquire a variety of information, such as chemical composition, grain size, surface topography, and crystalline phase. JEOL 845A uses a tungsten filament with a maximum beam pressure of 3 nA, allowing for very high-resolution imaging. Its high voltage beam scanning system allows for rapid image acquisition, and the adjustable working distance of the specimen holder allows for more flexibility in large samples. 845A is equipped with an alpha-backscattered electron detector (BSE) which detects and maps the surface micro-topography of a sample and makes it possible to differentiate between materials on the basis of their composition. JEOL 845A comes with an optional energy dispersive X-ray detector (EDS) that permits elemental analysis of a sample. Its low-vacuum operation allows it to analyze non-conductive materials at higher magnification than other SEMs. The EDS detector provides additional information about the composition and distribution of sample constituents, and can be used to determine phase fractions, identify trace elements, or determine particle size distributions. 845A offers rapid signal processing and image acquisition, making it suitable for hard-to-manipulate samples that require highly detailed imaging. It is equipped with an automated alignment and alignment correction system, and comes standard with a powerful Magnification Controller which permits precise focusing of the sample without manual intervention. Additionally, the end-user can adjust other parameters such as voltage and current to optimize image quality and signal strength. Overall, JEOL 845A offers a wide set of features and capabilities that makes it an excellent choice for high-resolution imaging and analysis of a variety of sample materials. Its capability to capture a variety of sample information with an optional EDS detector makes it a powerful tool for researchers looking for detailed analysis results.