Used JEOL ARM 200 F #9160516 for sale

JEOL ARM 200 F Scanning Electron Microscope (SEM) offers superior imaging capabilities for routine laboratory work and research. The high-performance equipment, with a resolution of 5 nm in all directions, is perfect for imaging of organic and inorganic matter. The instrument is well-suited for a wide range of applications, including crystallography, failure analysis, imaging of materials and their physical and chemical properties. The system includes a gaseous secondary electron detector (G-SE) for true 3D imaging, an ion source for EDS microanalysis, and a large low-background detector for maximizing the contrast of ultra-fine surface features. ARM 200 F SEM offers a vacuum environment and a wide range of magnifications from 8x to 500,000x. It is also equipped with a dual electron gun unit for superior beam stability and control. The machine's advanced features include a patented Focused Ion Beam technology for creating cross sections of samples. It is also equipped with a probe correction tool to ensure the best possible image quality. In addition, the asset provides automated operation, computer control, and a range of accessories such as a high-rise stage for the analysis of larger samples, and a digital imaging model for sample analysis and comparison. The powerful JEOL ARM 200 F SEM is a reliable tool for the electron microscopy community. It offers excellent performance for sophisticated imaging and analysis requirements at an affordable price. The equipment is user friendly and provides an intuitive and intuitive user interface. The robust and reliable structure provides excellent durability, ensuring that the system will continue to offer reliable and accurate results long into the future.